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Biometrika 1988 75(2):215-222; doi:10.1093/biomet/75.2.215
© 1988 by Biometrika Trust
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Analysis of one-way layout of count data with negative binomial variation

R. K. BARNWAL and S. R. PAUL

Department of Mathematics, and Statistics, University of Windsor Windsor, Ontario, Canada N9B3P4

Two C({alpha}) statistics (Neyman, 1959) for testing the equality of the means of several groups of count data in the presence of a common dispersion parameter are derived. The performance of the two C({alpha}) statistics, the likelihood ratio statistic and two more statistics based on transformed data (Anscombe, 1948) is then compared in terms of size and power by using Monte Carlo simulations. The C({alpha}) statistics are recommended. The C({alpha}) statistics for testing the equality of the dispersion parameters of several groups of count data are also derived. Two applications are given.

Key Words: Common dispersion parameter • C({alpha}) statistic • Equality of means • Equality of dispersion parameters • Negative binomial distribution


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