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Biometrika 1975 62(2):243-250; doi:10.1093/biomet/62.2.243
© 1975 by Biometrika Trust
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Omnibus test contours for departures from normality based on {surd}b1 and b2

K. O. BOWMAN and L. R. SHENTON

Computer Science Division, Union Carbide Corporation Oak Ridge, Tennessee
Office of Computer Activities, University of Georgia Athens

The test statistic X2({surd}b1)+X2(b2), where X({surd}b1) and X(b2) are standardized normal equivalents to the ample skewness, {surd}b1, and kurtosis, b2, statistics, is considered in normal sampling. Using the Johnson system, SU, and SB, as approximate normalizing distributions, contours in the ({surd}b1, b2) plane of the test statistic are set up for sample sizes ranging from 20 to 1000.

Key Words: Confidence contours • Departures from normality • Omnibus test • Sample skewness and kurtosis


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